Leica mis 200 - 150mm defect detection measurement

Leica Mis 200 - Defect detection measurement<br /> <br /> Vintage: 1995+/-5j<br /> SN: ?<br /> Wafersize: 150mm<br /> Former BelGaN MES/ERP name: REVIEW10<br /> <br /> Dimensions & weight estimates:<br /> Mainframe dim (cm): 140 x 145 x 95<br /> Mainframe weight (kg): 500<br /> <br /> Don't forget to check upcoming auctions at later dates of the compatible spare parts and subfab components to this tool.<br /> <br /> <br /> semiconductor BelGaN waferfab fab fab2 mainframe equipment tool

Startbod
€ 1500,00
Aantal biedingen
2
Huidig bod
€ 1600,00
Einddatum
Kavel nummer: 588874
Einddatum
Einde op 09/01/2025 16:14
Veilinghuis
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